The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
Sep. 22, 2005
Wataru Tanimoto, Tokyo, JP;
Hisato Noro, Tokyo, JP;
Wataru Tanimoto, Tokyo, JP;
Hisato Noro, Tokyo, JP;
JFE Steel Corporation, , JP;
Abstract
The press formability of a galvanized steel sheet including an oxide film, which has a thickness of 10 nm to 100 nm, as a surface layer is nondestructively speedily evaluated. A specific method for solving problems is characterized by including the steps of irradiating X-rays to a galvanized steel sheet, dispersing a fluorescent X-ray, which is excited and emitted in the applying, with an analyzing crystal exhibiting the difference in diffraction angle between a primary oxygen Kα x-ray and a secondary zinc Lβ x-ray of 2 degrees or more, detecting the X-ray, which is dispersed in the dispersing and which mainly contains the primary oxygen Kα x-ray, with a detector, separating an X-ray at an energy level within the range of ±25% to ±75% relative to the reference (100%) that is the energy level of the primary oxygen Kα x-ray from the X-ray, which is detected in the detecting and which mainly contains the primary oxygen Kα x-ray, by adjusting the window width of a pulse-height analyzer, measuring the intensity of the X-ray separated in the separating, and evaluating the press formability of the galvanized steel sheet on the basis of the intensity of the X-ray measured in the measuring.