The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2010

Filed:

Sep. 23, 2005
Applicants:

Jiang Hsieh, Brookfield, WI (US);

Xiangyang Tang, Waukesha, WI (US);

Inventors:

Jiang Hsieh, Brookfield, WI (US);

Xiangyang Tang, Waukesha, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for obtaining data includes scanning an object using a CT imaging system having at least two detector rows to acquire projection data, wherein the projection data includes at least some data obtained from at least two rows of the detector array, and reconstructing data representative an image of the object utilizing the projection data wherein the reconstruction includes pipelining the acquired projection data through a pipeline of operations including column-filtering, tomographic filtering, and backprojection. Thick reconstructed images using 3D backprojection can be obtained with significantly lessened artifacts relative to conventional 3D backprojection image reconstructions.


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