The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2010

Filed:

Dec. 19, 2007
Applicants:

Dae-sun Kim, Yongin-si, KR;

Jong-hyoung Lim, Hwaseong-si, KR;

Sang-ki Son, Seoul, KR;

Inventors:

Dae-sun Kim, Yongin-si, KR;

Jong-hyoung Lim, Hwaseong-si, KR;

Sang-ki Son, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There are provided a semiconductor memory device and a burn-in test method thereof. A semiconductor memory device according to an aspect of the invention includes a plurality of memory cell blocks, each of which includes a plurality of memory cells that are respectively coupled to a plurality of word lines and a plurality of bit lines, a word line control unit activating word lines in memory cell blocks that correspond to row address signals and word lines in memory cell blocks that do not correspond to the row address signals, during a test operation, and a write circuit writing data in the memory cell blocks that correspond to the row address signals and not writing data in the memory cell blocks that do not correspond to the row address signals, during the test operation.


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