The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
Jul. 10, 2006
K. Rickmer E. Kose, San Francisco, CA (US);
Bin Liu, San Jose, CA (US);
K. Rickmer E. Kose, San Francisco, CA (US);
Bin Liu, San Jose, CA (US);
Seagate Technology LLC, Scotts Valley, CA (US);
Abstract
A flaw scan system for detecting a location of first and second types of location specific anomalies on a storage disk of a hard disk drive comprising a write system, a read system, and first and second anomaly location systems. The write system writes a first set of bits to the storage disk in first and second data patterns. The read system reads the first set of bits from the storage disk. The first anomaly location system determines locations of the first type of location specific anomaly based on the first data pattern. The second anomaly location system determines locations of the second type of location specific anomaly based on the second data pattern.