The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
May. 13, 2008
Richard N. Gardner, Raleigh, NC (US);
John W. Wilson, Durham, NC (US);
Brian C. Cox, Durham, NC (US);
Reese A. Jernigan, Raleigh, NC (US);
David L. Reed, Chapel Hill, NC (US);
Richard N. Gardner, Raleigh, NC (US);
John W. Wilson, Durham, NC (US);
Brian C. Cox, Durham, NC (US);
Reese A. Jernigan, Raleigh, NC (US);
David L. Reed, Chapel Hill, NC (US);
Bright View Technologies, Inc., Morrisville, NC (US);
Abstract
Methods for creating apertures in a layer on a back side of a substrate that includes a microlens array on a front side thereof include curving the substrate into a cylindrical surface segment that defines an axis, so that the microlens array on the front side of the substrate faces the axis. A pulsed laser beam is scanned from the axis circumferentially along the cylindrical surface segment, to pass through the microlens array on the front side of the substrate and into the layer on the back side of the substrate to create the apertures, while simultaneously translating the substrate and/or the scanned pulsed laser beam axially relative to one another. Related apparatus and microlens array products are also disclosed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile