The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
Dec. 20, 2007
Laura M. Lechuga Gomez, Madrid Tres Cantos, ES;
Mar Alvarez Sanchez, Victoria, AU;
Francisco Javier Tamayo DE Miguel, Madrid Tres Cantos, ES;
Laura M. Lechuga Gomez, Madrid Tres Cantos, ES;
Mar Alvarez Sanchez, Victoria, AU;
Francisco Javier Tamayo de Miguel, Madrid Tres Cantos, ES;
Consejo Superior de Investigaciones Cientificas, Madrid, ES;
Abstract
The invention relates to a system and method for detecting the displacement, such as the deflection, of a plurality of elements (), such as microcantilevers, forming part of an array (), by emitting a light beam () towards the array () and by receiving a reflected light beam on an optical position detector, whereby the position of incidence of the light beam is determined by the displacement of the corresponding element. The system further comprises: scanning means () for the displacing the light beam () along the array () so that the light beam is sequentially reflected, by the individual elements () along said array (); and reflection detecting means () for detecting when the light beam is reflected by an element. The system is arranged so that when the reflection detecting means () detect that the light beam is reflected by an element, the corresponding position of incidence of the light on the detector is taken as an indication of the displacement of the element.