The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
Oct. 24, 2006
Applicants:
Takahiro Nakaminami, Osaka, JP;
Akihito Kamei, Kyoto, JP;
Atsushi Fukunaga, Osaka, JP;
Inventors:
Assignee:
Panasonic Corporation, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A measuring device for analyzing an analyte contained in a sample. The device includes a hollow housing, a sample holding part provided inside the housing for holding the sample, a sample supply inlet provided for the housing so as to communicate with the sample holding part, an optical measurement part provided for the sample holding part for making an optical measurement, a reagent holding part provided for the sample holding part for holding a reagent for the optical measurement, and at least one electrode provided on an outer surface of the housing.