The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2010

Filed:

Aug. 12, 2008
Applicant:

Han-chung Lai, Hsinchu, TW;

Inventor:

Han-Chung Lai, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1333 (2006.01); G02F 1/1343 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for repairing a storage capacitor on gate or a storage capacitor on common line is described. A portion of each pixel electrode is disposed above a scan line or a common line. An upper electrode is disposed between the pixel electrode and the corresponding scan line or the common line. The pixel electrode and the upper electrode are electrically connected. A defective capacitor is formed when a particle/defect is produced between the upper electrode and the common line or the scan line. The method of repairing the defective capacitor includes removing a portion of the pixel electrode corresponding to the upper electrode of a defective storage capacitor and electrically isolating the upper electrode and the corresponding pixel electrode of the defective storage capacitor. The upper electrode and the scan line or the common line of the defective capacitor are welded together.


Find Patent Forward Citations

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Lai, Han-Chung. (2010). Repairing method of a thin film transistor array substrate (U.S. Patent No. 7646446). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7646446

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