The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7646020 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 12, 2010

Filed:

Aug. 31, 2007
Applicants:

Shuichi Takeuchi, Kawasaki, JP;

Hidehiko Kira, Kawasaki, JP;

Inventors:

Shuichi Takeuchi, Kawasaki, JP;

Hidehiko Kira, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/04 (2006.01); H01L 31/20 (2006.01); H01L 31/036 (2006.01); H01L 23/52 (2006.01); H01L 23/48 (2006.01); H01L 29/40 (2006.01); H01L 21/66 (2006.01); H01L 21/50 (2006.01); H01L 21/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

When bonding a workpiece to a substrate, processed parts of the substrate and the workpiece are observed and behavior such as the production of voids and the flowing of resin is observed. An apparatus for observing an assembled state of components includes: a stage on which a substrate is set; a head mechanism that bonds, by applying heat and pressure, an observation workpiece made of a transparent material to the substrate via resin supplied between the substrate and the observation workpiece; a light source that irradiates an observed part of the substrate and the observation workpiece mounted on the stage with light; and a camera that takes, from the observation workpiece side, an image of the observed part when the observation workpiece is bonded to the substrate set on the stage.


Find Patent Forward Citations

Takeuchi, Shuichi. (2010). Apparatus for observing an assembled state of components and method of observing an assembled state of components using such apparatus (U.S. Patent No. 7646020). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7646020

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