The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
Dec. 28, 2006
Chuanxiang Tang, Beijing, CN;
Huaibi Chen, Beijing, CN;
Yinong Liu, Beijing, CN;
Jianping Cheng, Beijing, CN;
Yaohong Liu, Beijing, CN;
Renkai LI, Beijing, CN;
Chuanxiang Tang, Beijing, CN;
Huaibi Chen, Beijing, CN;
Yinong Liu, Beijing, CN;
Jianping Cheng, Beijing, CN;
Yaohong Liu, Beijing, CN;
Renkai Li, Beijing, CN;
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
Disclosed is a device for outputting high and/or low energy X-rays, in which the electron gun power supply provides power to the electron linear accelerating tube under the control of the control system; the microwave power source accelerates electron beams generated by the electron linear accelerating tube under the control of the control system; the electron linear accelerating tube is connected to the electron gun power supply and the microwave power source respectively, to generate high energy electron beams; the high-voltage electron gun power supply provides power to the high-voltage electron gun under the control of the control system; the high-voltage electron gun is connected to the voltage electron gun power supply to generate low energy electron beams; the radiation target receives the high energy electron beams to generate high energy transmission X-rays, and/or receive the low energy electron beams to generate low energy reflection X-rays. The present invention can be applied in the radiotherapy and the medical imaging, or can be applied in the nondestructive inspection.