The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2010
Filed:
Apr. 30, 2007
Cheng-wen Wu, Hsinchu, TW;
Rei-fu Huang, Tainan, TW;
Chin-lung Su, Taipei, TW;
Wen-ching Wu, Hsinchu, TW;
Kun-lun Luo, Hsinchu, TW;
Cheng-Wen Wu, Hsinchu, TW;
Rei-Fu Huang, Tainan, TW;
Chin-Lung Su, Taipei, TW;
Wen-Ching Wu, Hsinchu, TW;
Kun-Lun Luo, Hsinchu, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
Disclosed is a build-in self-diagnosis and repair method and apparatus in a memory with syndrome identification. It applies a fail-pattern identification and a syndrome-format structure to identify at least one type of faulty syndrome in the memory during a memory testing, then generates and exports fault syndrome information associated with the corresponding faulty syndrome. According to the fault syndrome information, the method applies a redundancy analysis algorithm, allocates spare memory elements and repairs the faulty cells in the memory. The syndrome-format structure respectively applies single-faulty-word-syndrome format, faulty-row-segment-syndrome format, and faulty-column-segment-syndrome format for different faulty syndromes, such as faulty row segments and single faulty words, faulty column segments and single faulty words, all of single faulty words, faulty row segments and faulty column segments, and so on.