The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2010

Filed:

Mar. 05, 2007
Applicants:

Hualin Tan, Novi, MI (US);

Christopher A. Kinser, Grand Blanc, MI (US);

Edmund F. Gaffney, White Lake, MI (US);

Inventors:

Hualin Tan, Novi, MI (US);

Christopher A. Kinser, Grand Blanc, MI (US);

Edmund F. Gaffney, White Lake, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 15/00 (2006.01); G01M 17/00 (2006.01); G06F 7/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring and storing values of sensor bias in acceleration values for a vehicle, obtained over a plurality of time periods from a sensor having a specified range of expected variability of sensor bias values, includes measuring a first value of sensor bias obtained during operation of the vehicle in a first time period, storing the measured first value of sensor bias for use in one or more subsequent time periods, measuring a second value of sensor bias obtained during operation of the vehicle in a second time period, subtracting the measured second value of sensor bias from the stored first value of sensor bias, thereby generating a sensor bias difference, and storing the measured second value of sensor bias, for reference in one or more subsequent time periods, if the sensor bias difference is within the specified range of expected variability of sensor bias values.


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