The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7643759 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 05, 2010

Filed:

Jan. 12, 2006
Applicant:

Masato Tanaka, Yokohama, JP;

Inventor:

Masato Tanaka, Yokohama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/00 (2006.01); H03M 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a signal-quality evaluation device and a signal adjustment method which require shorter evaluation time and which have high flexibility of application. A signal quality evaluation deviceincludes an optical componentand an optical output detector. In the optical component, an output optical power Pis a function of an input optical power P, and this function P(P) has at least one maximum point. The optical output detectordetects the time-average power of light output from the optical component


Find Patent Forward Citations

Tanaka, Masato. (2010). Signal-quality evaluation device, signal adjustment method, optical-signal evaluation system, and optical transmission system (U.S. Patent No. 7643759). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7643759

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…