The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2010
Filed:
Mar. 18, 2005
Benoit Jules Jurion, Seattle, WA (US);
Gavin M. Gear, Bothell, WA (US);
Jamie N. Wakeam, Redmond, WA (US);
Timothy H. Kannapel, Bellevue, WA (US);
Todd M. Landstad, Redmond, WA (US);
Sebastian Poulose, Sammamish, WA (US);
Zoltan C. Szilagyi, Bellevue, WA (US);
Lidia Schwarz, Redmond, WA (US);
Roman Snytsar, Redmond, WA (US);
Sashi Raghupathy, Redmond, WA (US);
Subha Bhattacharyay, Bellevue, WA (US);
Richard J. Duncan, Kirkland, WA (US);
Terri Chudzik, Seattle, WA (US);
Amber P. Race, Seattle, WA (US);
Jerome J. Turner, Redmond, WA (US);
Haiyong Wang, Bellevue, WA (US);
Herry Sutanto, Redmond, WA (US);
Benoit Jules Jurion, Seattle, WA (US);
Gavin M. Gear, Bothell, WA (US);
Jamie N. Wakeam, Redmond, WA (US);
Timothy H. Kannapel, Bellevue, WA (US);
Todd M. Landstad, Redmond, WA (US);
Sebastian Poulose, Sammamish, WA (US);
Zoltan C. Szilagyi, Bellevue, WA (US);
Lidia Schwarz, Redmond, WA (US);
Roman Snytsar, Redmond, WA (US);
Sashi Raghupathy, Redmond, WA (US);
Subha Bhattacharyay, Bellevue, WA (US);
Richard J. Duncan, Kirkland, WA (US);
Terri Chudzik, Seattle, WA (US);
Amber P. Race, Seattle, WA (US);
Jerome J. Turner, Redmond, WA (US);
Haiyong Wang, Bellevue, WA (US);
Herry Sutanto, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A system and method for assisting with analysis and recognition of ink is described. Analysis hints may be associated with a field. The field may receive electronic ink. Based on the identity of the field and the analysis hint associated with it, at least one of analysis and recognition of ink may be assisted.