The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7643365 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 05, 2010

Filed:

Apr. 29, 2005
Applicants:

Tetsumasa Meguro, Tokyo, JP;

Yoshikazu Kurose, Tokyo, JP;

Inventors:

Tetsumasa Meguro, Tokyo, JP;

Yoshikazu Kurose, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 5/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor integrated circuit able to operate by different power supply voltages resulting from fluctuations in production, provided with a process monitor circuit for obtaining a grasp of a delay characteristic corresponding to the conditions of a production process, a memory circuit for storing data concerning an extent of process variation acquired by the process monitor circuit, and a power supply voltage control circuit for adaptively controlling the power supply voltage in accordance with the extent of process variation acquired by the process monitor circuit and stored in the memory circuit, and a test method for guaranteeing the operation of the semiconductor integrated circuit.


Find Patent Forward Citations

Meguro, Tetsumasa. (2010). Semiconductor integrated circuit and method of testing same (U.S. Patent No. 7643365). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7643365

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