The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2010

Filed:

Jul. 30, 2007
Applicant:

Hiroya Fukuyama, Machida, JP;

Inventor:

Hiroya Fukuyama, Machida, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention enables switching between wide-field observation and high-magnification observation during in vivo examination of a small laboratory animal or the like using a narrow-diameter objective lens, without changing the objective lens. There is provided a microscope optical system including an objective lens for collecting light from an examination target; an image-forming lens for imaging the light collected by the objective lens onto a detection device; and an auxiliary optical system, having positive power, which is provided so as to be capable of being inserted in and removed from a light path between the objective lens and the image-forming lens.


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