The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2010

Filed:

Oct. 16, 2007
Applicants:

Hiroyuki Okuwaki, Kanagawa, JP;

Yasuhiro Naoe, Kanagawa, JP;

Ryouji Hirai, Kanagawa, JP;

Shinichi Ozaki, Kanagawa, JP;

Jun Ando, Kanagawa, JP;

Inventors:

Hiroyuki Okuwaki, Kanagawa, JP;

Yasuhiro Naoe, Kanagawa, JP;

Ryouji Hirai, Kanagawa, JP;

Shinichi Ozaki, Kanagawa, JP;

Jun Ando, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical scanner that performs scanning by deflecting plural light beams using a single deflector. The optical scanner includes plural pre-scanning optical systems configured to emit the plural light beams and each including a light source. A first of the pre-scanning optical systems emits a first of the light beams to be deflected by the deflecting unit. A second of the pre-scanning optical systems emits a second of the light beams and is disposed in the position different from a position of the first pre-scanning optical system in a rotational axis direction of the deflector.


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