The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2010
Filed:
Jun. 14, 2006
Masayuki Naya, Ashigarakami-gun, JP;
Takeharu Tani, Ashigarakami-gun, JP;
Masayuki Naya, Ashigarakami-gun, JP;
Takeharu Tani, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A new and novel sensor having a simple structure with high detection sensitivity. The sensor (S) includes the following from measuring light (L) input side in the order listed below: a first reflector () having semi-transmissive and semi-reflective properties; a translucent body (); and a second reflector () having perfect reflection properties, or semi-transmissive and semi-reflective properties. The first reflector () and/or second reflector is brought into contact with a specimen, and the average complex refractive index varies with the specimen. Absorption properties for absorbing light having a particular wavelength are produced by these components, the properties of the measuring light (L) are changed by the optical properties including the absorption properties, the output light (L) is outputted from the first reflector () and/or second reflector (), and the physical properties of the output light (L) that vary according to the optical properties are detected.