The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2010
Filed:
Jan. 20, 2006
Evan F. Cromwell, Redwood City, CA (US);
Steven C. Miller, Union City, CA (US);
Robert T. Trujillo, Saratoga, CA (US);
Paul B. Comita, Menlo Park, CA (US);
Evan F. Cromwell, Redwood City, CA (US);
Steven C. Miller, Union City, CA (US);
Robert T. Trujillo, Saratoga, CA (US);
Paul B. Comita, Menlo Park, CA (US);
Blueshift Biotechnologies, Inc., Sunnyvale, CA (US);
Abstract
Methods and apparatus for performing scatterometry measurements of biological samples as described herein. A substrate having formed therein one or more sample wells is provided. Each sample well is configured to hold a sample solution containing objects that are to be characterized based on their light scattering properties. One or more sample solutions are dispensed into the sample wells. A specular reflection reducing element is applied to at least some of the sample solutions in the sample wells to decrease reflections of light into one or more detectors. A light beam is directed from a light source onto the objects in the sample wells. Light scattered by the objects in the sample wells is collected and transmitted to one or more detectors. The signal from the detectors is analyzed to detect the one or more characteristics of the one or more samples.