The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2010
Filed:
Sep. 28, 2005
Alan Sangone Chen, Windermere, FL (US);
Daniel J. Dolan, Jr., Cottage Grove, MN (US);
David W. Kelly, Lino Lakes, MN (US);
Daniel Charles Kerr, Orlando, FL (US);
Stephen C. Kuehne, Rosemount, MN (US);
Alan Sangone Chen, Windermere, FL (US);
Daniel J. Dolan, Jr., Cottage Grove, MN (US);
David W. Kelly, Lino Lakes, MN (US);
Daniel Charles Kerr, Orlando, FL (US);
Stephen C. Kuehne, Rosemount, MN (US);
Agere Systems Inc., Allentown, PA (US);
Abstract
An integrated circuit having an n-channel MOSFET device and a JFET device. The integrated circuit includes a semiconductor layer having an upper surface, an MOS transistor device formed in a doped well of a first conductivity type extending from the semiconductor upper surface and a JFET device. The JFET device includes a channel region in the semiconductor layer spaced from, and having a peak concentration positioned a predetermined distance below, the upper surface. An associated method of manufacturing includes introducing p-type dopant into the semiconductor surface to form a p-well in which the NMOS device is formed and a source and a drain of the JFET device. N-type dopant is introduced into the semiconductor surface to form an n-type region of the NMOS device below the p-well and a gate region of the JFET device. P-type dopant is introduced into the semiconductor layer to simultaneously form a higher concentration p-type region in the p-well of the NMOS device and a channel region extending between the source and drain of the JFET.