The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2010
Filed:
Jun. 27, 2007
Allen Erik Sjogren, Park City, UT (US);
Eric Nerdrum, Kaysville, UT (US);
Michael Harney, Pleasant Grove, UT (US);
Allen Erik Sjogren, Park City, UT (US);
Eric Nerdrum, Kaysville, UT (US);
Michael Harney, Pleasant Grove, UT (US);
Fluke Corporation, Everett, WA (US);
Abstract
An apparatus and method for testing thermal switches is disclosed including modulating the temperature of a receiver in thermal contact with a thermal switch at a first rate within a range containing the nominal switch temperature of the thermal switch. A first temperature at which the switch changes state is recorded. The temperature is then modulated at a second rate and a second temperature at which the switch again changes state is recorded. The temperature may be modulated at a third rate slower than the second rate to determine a third temperature. The first, second, and third switch temperatures are then processed and output to an operator. The first, second, and third rates may be determined according to an exponentially decreasing function.