The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2010
Filed:
Jul. 31, 2007
Masanori Hangai, Kyoto, JP;
Nagahisa Yoshimura, Kyoto, JP;
Yijun Huang, Pleasantvile, NY (US);
Ryoichi Nadachi, Fujimino, JP;
Masanori Hangai, Kyoto, JP;
Nagahisa Yoshimura, Kyoto, JP;
Yijun Huang, Pleasantvile, NY (US);
Ryoichi Nadachi, Fujimino, JP;
Kabushiki Kaisha Topcon, Itabashi-Ku, JP;
Abstract
An ophthalmologic examination apparatusprojects a light onto a fundus oculi, detects the reflected light thereof, and forms a 3-dimensional image that represents the morphology of a retina based on the detected results. A stimulation-position specifying partspecifies, in the 3-dimensional image, a plurality of stimulation positions that correspond to a plurality of stimulation points Pi in a visual-field examination. A layer-thickness measuring partanalyzes the 3-dimensional image to find the layer thickness of the retina at each stimulation position. In addition, a displacement calculation partspecifies a related position of the stimulation position. A layer-thickness measuring partfinds the layer thickness of the retina at the related position.