The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2009
Filed:
Apr. 12, 2005
William Preston Alexander, Iii, Austin, TX (US);
Scott Thomas Jones, Austin, TX (US);
Frank Eliot Levine, Austin, TX (US);
Robert John Urquhart, Austin, TX (US);
William Preston Alexander, III, Austin, TX (US);
Scott Thomas Jones, Austin, TX (US);
Frank Eliot Levine, Austin, TX (US);
Robert John Urquhart, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for collecting a plurality of metrics during a single run of a computer program. The mechanism of the present invention initializes a plurality of counters to count events associated with metrics of interest. The mechanism of the present invention then counts the occurrence of events associated with metrics of interest during a single execution of a computer program. Responsive to a determination that a counter in a plurality of counters has generated an interrupt, the interrupt is rerouted to an interrupt handler, wherein the interrupt handler generates trace records comprising trace information corresponding to the interrupt. The mechanism of the present invention then generates profiles for the trace records, wherein the profiles differentiate the trace records based on the metric type associated with each trace record.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile