The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2009
Filed:
Apr. 25, 2006
Chennagiri P. Ravikumar, Bangalore, IN;
Nisar Ahmed, Richardson, TX (US);
Chennagiri P. Ravikumar, Bangalore, IN;
Nisar Ahmed, Richardson, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method and/or a system of at-speed transition fault testing with low speed scan enable is disclosed. In one embodiment, a digital system includes any number of scan chains. Each scan chain may have any number of scan cells, an at-speed local scan enable signal to control a mode of operation, and any number of last transition generator cells. In addition, each last transition generator cell includes a first flip-flop with an output connected to a second flip-flop input, an input multiplexer to apply any one of a first flip-flop output data and an OR gate having a first flip-flop input based on a state of the at-speed local scan enable signal, and an OR gate having a first flip-flop output and the global scan enable signal as inputs to generate the at-speed local scan enable signal based on a state of the global scan enable signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile