The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2009
Filed:
Dec. 21, 2007
John J. Seibold, Frisco, TX (US);
John J. Seibold, Frisco, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A test system in an integrated circuit includes a boundary scan cell. The boundary scan cell includes a first storage element and a second storage element connected in series with the first storage element. The boundary scan cell also includes initialization logic connected between an output of the first storage element and an input of the second storage element. The initialization logic provides the output of the first storage element to the input of the second storage element unchanged during a first operating state, and provides an inverted version of the output of the first storage element to the input of the second storage element during a second operating state. A bi-directional element is connected to receive an output of the second storage element, the bi-directional element feeding the output of the second storage element to an input of the first storage element, such that capture of a state change at the output of the first storage element at the output of the first storage element is facilitated during the second operating state.