The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2009
Filed:
Apr. 24, 2006
Applicants:
Stephan W. Wegerich, Geneva, IL (US);
Andre Wolosewicz, Woodridge, IL (US);
Xiao Xu, Naperville, IL (US);
James P. Herzog, Downers Grove, IL (US);
Robert Matthew Pipke, Oak Park, IL (US);
Inventors:
Stephan W. Wegerich, Geneva, IL (US);
Andre Wolosewicz, Woodridge, IL (US);
Xiao Xu, Naperville, IL (US);
James P. Herzog, Downers Grove, IL (US);
Robert Matthew Pipke, Oak Park, IL (US);
Assignee:
SmartSignal Corporation, Lisle, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for systematically configuring and deploying an empirical model used for fault detection and equipment health monitoring. The method is driven by a set of data preprocessing and model performance metrics subsystems that when applied to a raw data set, produce an optimal empirical model.