The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2009
Filed:
Nov. 03, 2004
Calvin J. Bittner, Essex Junction, VT (US);
Steven A. Grundon, Underhill, VT (US);
Yoo-mi Lee, Essex Junction, VT (US);
Ning LU, Essex Junction, VT (US);
Josef S. Watts, South Burlington, VT (US);
Calvin J. Bittner, Essex Junction, VT (US);
Steven A. Grundon, Underhill, VT (US);
Yoo-Mi Lee, Essex Junction, VT (US);
Ning Lu, Essex Junction, VT (US);
Josef S. Watts, South Burlington, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system and program product are disclosed for statistical modeling an integrated circuit that provides information about partial correlations between model parameters. The invention determines a variance-covariance matrix for data to be modeled; conducts principal component analysis on the variance-covariance matrix; and creates a statistical model with an independent distribution for each principal component, allowing calculation of each individual model parameter as a weighted sum by a circuit simulator. The statistical model provides information about how well individual transistors will track one another based on layout similarity. This allows the designer to quantify and take advantage of design practices that make all transistors similar, for example, by orienting all gates in the same direction. A method, system and program product for simulating a circuit using the statistical model are also included.