The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2009

Filed:

Oct. 17, 2005
Applicants:

Juntaro Sahara, Kanagawa, JP;

Yasushi Mutoh, Kanagawa, JP;

Takanori Miyasaka, Kanagawa, JP;

Masanobu Yamazoe, Kanagawa, JP;

Inventors:

Juntaro Sahara, Kanagawa, JP;

Yasushi Mutoh, Kanagawa, JP;

Takanori Miyasaka, Kanagawa, JP;

Masanobu Yamazoe, Kanagawa, JP;

Assignee:

NSK Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 17/40 (2006.01); G21C 17/00 (2006.01); G01R 23/16 (2006.01); G01H 1/08 (2006.01); G01M 13/04 (2006.01); G01N 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are an envelope processor, for obtaining an envelope for a detected signal; a FFT unit, for converting the envelope into a frequency spectrum; a peak detector, for smoothing the frequency spectrum by calculating a moving average, for further performing smoothing and differentiation for the spectrum, and detecting, as peaks, frequency points at which a sign of a differential coefficient is changed from positive to negative, for extracting peaks having a predetermined threshold value or greater, and for sorting the extracted peaks and detecting upper peaks; and a diagnosis processor T, for diagnosing an abnormality based on the detected peaks.


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