The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2009
Filed:
Mar. 28, 2007
Makoto Ono, Kanagawa, JP;
Yasunori Nishimoto, Kanagawa, JP;
Hiroshi Fukuyama, Kanagawa, JP;
Shigeyuki Nakagawa, Kanagawa, JP;
Makoto Ono, Kanagawa, JP;
Yasunori Nishimoto, Kanagawa, JP;
Hiroshi Fukuyama, Kanagawa, JP;
Shigeyuki Nakagawa, Kanagawa, JP;
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
Embodiments of the present invention provide a data group for each parameter that is classified into a first group and a second group, based on the performance of the products, a base point of a distribution of the data group is calculated, based on the distribution, and a distance range from the base point is decided. The number of data within this range belonging to the first group is counted and substituted for variable FX, the number of data belonging to the second group is counted and substituted for variable SX, the number of data outside this certain range belonging to the first group is counted and substituted for variable FY, and the number of data belonging to the second group is counted and substituted for variable SY. Moreover, a failure content ratio is calculated from variables FX, FY, SX and SY, and the yield impact is calculated.