The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2009
Filed:
Jul. 19, 2007
George R. Kear, Slidell, LA (US);
Anish Kumar, Katy, TX (US);
David Williamson, Missouri City, TX (US);
Gamal E. Shehab, Heliopolis, EG;
George R. Kear, Slidell, LA (US);
Anish Kumar, Katy, TX (US);
David Williamson, Missouri City, TX (US);
Gamal E. Shehab, Heliopolis, EG;
Schlumberger Technology Corporation, Sugar Land, TX (US);
Abstract
Computer-based method and system are disclosed for interpreting dips, dip trends, and mineral based lithofacies data to identify certain geological events in a subsurface formation. The disclosed method/system analyzes dip magnitude and azimuth data to determine the dip trends in the formation. The dip trends are then examined for indications of the presence of certain depositional events, such as build-ups, flow directions instances of scour and fill, direction to thalweg, parallel bedding, indications of fault, and the like. If lithofacies data is available the disclosed method/system can also analyze this data to identify the presence of interbedded sequences and condensed sections. Such an integrated solution saves geoscientists and interpreters an enormous amount of time compared to existing interpretation techniques, allowing them to be much more productive. The disclosed system/method may also be used to help train new and less experienced geoscientists and interpreters.