The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2009
Filed:
May. 16, 2005
Jae-han Jung, Seoul, KR;
Jae-han Jung, Seoul, KR;
Samsung Electronics., Ltd., Suwon-si, KR;
Abstract
An apparatus to measure noise in an image signal and a method thereof. The apparatus includes an area division unit to divide an image signal having noise therein into a plurality of areas and to output area information corresponding to the plurality of areas, a variance calculation unit to calculate variances of the plurality of areas using the area information, the image signal and a noise-attenuated image signal obtained by attenuating the noise from the image signal, and a noise determination unit to determine an amount of noise in the image signal by comparing the calculated variances of the plurality of areas. Accordingly, the noise measurement apparatus can measure the amount of noise irrespective of characteristics of the image signal, and thus noise attenuation can be performed more accurately.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile