The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2009

Filed:

Dec. 12, 2006
Applicants:

Paul M. Butterfield, Ontario, NY (US);

Mark A. Gwaltney, Fairport, NY (US);

Connie F. Purdum, Rochester, NY (US);

Carlos O. Alva, Penfield, NY (US);

Inventors:

Paul M. Butterfield, Ontario, NY (US);

Mark A. Gwaltney, Fairport, NY (US);

Connie F. Purdum, Rochester, NY (US);

Carlos O. Alva, Penfield, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/02 (2006.01); G06T 3/40 (2006.01); G06F 3/12 (2006.01); H04N 1/393 (2006.01);
U.S. Cl.
CPC ...
Abstract

Test image data is introduced into the image processing path of a marking device, at various points prior to the marking engine. Comparison of output of the marking engine from various sources of image data is made to diagnose imaging path component failure. Imaging data at various points in the image processing path is captured for analysis as part of component failure diagnosis. Various memory devices are used to both introduce test data at various points in the image processing path and capture data at various points of the image processing path.


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