The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2009

Filed:

Dec. 10, 2004
Applicants:

Nobuhiro Aihara, Osaka, JP;

Hiroshi Sakai, Sakai, JP;

Inventors:

Nobuhiro Aihara, Osaka, JP;

Hiroshi Sakai, Sakai, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06K 1/00 (2006.01); G06K 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a printer which corrects a density change by measuring densities of a plurality of output dither patterns (test patterns) by a sensor and obtaining a γ characteristic curve, the following processes are performed. Data of the present number of print sheets is obtained from a print sheet counter in the printer. On the basis of the obtained data, a proper sensor density curve is selected. A sensor value obtaining unit obtains density data of a generated test pattern. On the basis of the selected sensor density curve and the obtained density data, a γ characteristic curve is calculated. A dither pattern is generated based on the γ characteristic curve.


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