The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2009

Filed:

Feb. 10, 2005
Applicants:

Enis Ersue, Darmstadt, DE;

Joerg Amelung, Darmstadt, DE;

Inventors:

Enis Ersue, Darmstadt, DE;

Joerg Amelung, Darmstadt, DE;

Assignee:

Isra Vision System AG, Darmstadt, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The method of inspecting the surface of a three-dimensional body, includes moving at least one camera and at least one illuminating device relative to the surface of the three-dimensional body, taking pictures of the areas of the surface to be inspected during the movement of the at least one camera relative to the areas of the surface to be inspected, transmitting the pictures taken to a computer and evaluating the pictures in the computer to find any defects that are present. A system for performing the method is also described. In order to obtain high inspection quality, the camera, illumination device and the surface to be inspected are brought into plural different defined geometric relationships with each other during the inspecting of each of the areas on the surface, at least for a time period required to take one picture.


Find Patent Forward Citations

Ersue, Enis. (2009). Method and system for inspecting surfaces (U.S. Patent No. 7639349). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7639349

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…