The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2009
Filed:
Oct. 31, 2005
D. Mitchel Hanks, Fort Collins, CO (US);
Lawrence Nathaniel Taugher, Loveland, CO (US);
Greg J. Lipinski, Loveland, CO (US);
Kevin L. Colburn, Greeley, CO (US);
Charles R. Weirauch, Loveland, CO (US);
D. Mitchel Hanks, Fort Collins, CO (US);
Lawrence Nathaniel Taugher, Loveland, CO (US);
Greg J. Lipinski, Loveland, CO (US);
Kevin L. Colburn, Greeley, CO (US);
Charles R. Weirauch, Loveland, CO (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
An optical scanning device and method are provided for marking an optically sensitive layer. The device can include an optical source capable of emitting a beam. At least one pivot can be configured to enable the beam to travel through a beam output arc. In addition, a mirror surface can be oriented toward the optically sensitive layer. The mirror surface can be configured to reflect the beam within the defined beam output arc onto a plurality of locations of the optically sensitive layer.