The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2009
Filed:
Jul. 13, 2006
Seockhoon Bae, Cupertino, CA (US);
Donghoon Lee, Seoul, KR;
Seungyob Kim, Seoul, KR;
Sungwook Cho, Bucheon, KR;
Seockhoon Bae, Cupertino, CA (US);
Donghoon Lee, Seoul, KR;
Seungyob Kim, Seoul, KR;
Sungwook Cho, Bucheon, KR;
INUS Technology, Inc., Seoul, KR;
Abstract
An automated mechanism that identifies and defines a global coordinate system that is most appropriate for a collection of raw 3D scan data used to form a mesh model is discussed. More specifically, a coordinate system is identified that is able to minimize the total sum of deviation error while also minimizing the peak error for raw 3D scan data. The present invention searches for appropriate coordinate systems from raw 3D scan data in a fully automated way. Multiple coordinate systems in order of likelihood of leading to minimal global deviation error are identified and presented to a user. End users are also allowed to edit suggested coordinate system parameters interactively prior to the alignment of the 3D scan data being transformed based on a selected coordinate system.