The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2009
Filed:
Apr. 25, 2006
Murari Kejariwal, Austin, TX (US);
Prisad Ammisetti, Austin, TX (US);
Axel Thomsen, Austin, TX (US);
John Laurence Melanson, Austin, TX (US);
Murari Kejariwal, Austin, TX (US);
Prisad Ammisetti, Austin, TX (US);
Axel Thomsen, Austin, TX (US);
John Laurence Melanson, Austin, TX (US);
Cirrus Logic, Inc., Austin, TX (US);
Abstract
A method of testing an integrated circuit including a plurality of test nodes includes initiating a test mode and, during a first time interval of the test mode, stepping a level of a supply current of the integrated circuit to a calibration level. Parameters are observed at the plurality of test nodes to detect errors during a second time interval of the test mode and the level of the supply current selectively stepped in response to a number of errors detected. The level of the supply current is decoded to identify the detected errors.