The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2009
Filed:
Jul. 27, 2007
Michael W. Belford, Los Altos, CA (US);
Jean Jacques Dunyach, San Jose, CA (US);
Michael W. Belford, Los Altos, CA (US);
Jean Jacques Dunyach, San Jose, CA (US);
Thermo Finnigan LLC, San Jose, CA (US);
Abstract
A method for analyzing ions includes providing a desolvation chamber in communication with an analytical gap of a FAIMS analyzer, via an ion inlet orifice. A flow of ions is introduced into the desolvation chamber along a flow path that is toward the ion inlet orifice and into the analytical gap of the FAIMS analyzer. A flow of a desolvation gas is provided into the desolvation chamber via a first gas inlet, such that a portion of the flow of the desolvation gas is counter-current to the flow of ions. A flow of a carrier gas is provided separately via a second gas inlet, which is defined downstream relative to the desolvation chamber. In particular, the composition of the carrier gas is different than the composition of the desolvation gas. Accordingly, the flow of the carrier gas is provided substantially into the analytical gap for transporting ions along a path between the ion inlet orifice and an ion outlet orifice of the analytical gap.