The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2009

Filed:

May. 19, 2005
Applicants:

Kenji Kawaguchi, Kyoto, JP;

Masanobu Obayashi, Kyoto, JP;

Nami Kurauchi, Kyoto, JP;

Inventors:

Kenji Kawaguchi, Kyoto, JP;

Masanobu Obayashi, Kyoto, JP;

Nami Kurauchi, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/00 (2006.01); G01K 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In order to measure specific heat, the measurement time is very long and the instrument is very expensive. The specific heat may be calculated based on the thermal time constant obtained from the change of the sample temperature when the predetermined amount of sample with known density at the first temperature is introduced in the environment at the second temperature. This measuring method can use the oscillatory densitometer. The predetermined amount corresponds to the volume of the sample to be introduced in the oscillatory densitometer, the density is a measurement result of the oscillatory densitometer, and the thermal time constant corresponds to the time constant of the oscillation period of the oscillatory densitometer.


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