The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2009

Filed:

Jan. 15, 2008
Applicants:

Abdolreza Saied, Carmichael, CA (US);

James I-che Lee, Sacramento, CA (US);

Inventors:

Abdolreza Saied, Carmichael, CA (US);

James I-Che Lee, Sacramento, CA (US);

Assignee:

VORTRAN Medical Technology 1, Inc., Sacramento, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 13/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring device for detecting and indicating changes in fluid pressure of a test environment relative to ambient fluid conditions, wherein the measuring device includes a linear gear rack having an alignment spur, an indicator needle associated pinion gear, calibrated indicia for visual measure of a pressure change event, and a deflectable diaphragm element. The alignment spur acts upon the pinion gear by maintaining close relationship of the linear gear rack and the needle associated pinion gear and counteracts torque and off-center forces created by the linear rack gear upon deflection of the deflectable diaphragm, thus providing improved resolution of small pressure changes and increased accuracy of measurement as the measuring device operates through a cycling period.


Find Patent Forward Citations

Saied, Abdolreza. (2009). Pressure measuring manometer with alignment spur (U.S. Patent No. 7637165). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7637165

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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