The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2009

Filed:

Dec. 22, 2004
Applicants:

Masahiro Murakawa, Tokyo, JP;

Keiichi Ito, Tokyo, JP;

Inventors:

Masahiro Murakawa, Tokyo, JP;

Keiichi Ito, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06G 7/00 (2006.01); G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A parameter adjusting device configured to adjust a great number of parameters of a physical model by a genetic algorithm using multiple processing units within a short time. A parameter adjusting device comprises a processing assignment means wherein a part of a multiple processing means is assigned to search processing by a local search method, and assigns the processing of the local search to a low-performance processor. Also, the parameter adjusting device collects an interim result of the search by a genetic algorithm, and uses it for the search processing by the local search method. Through parallelization and efficiency of an adjusting processing by effectively utilizing the resource in the system, the parameter adjusting device can determine the group of the most appropriate parameters within a short time.


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