The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2009
Filed:
Sep. 12, 2007
Yoshiaki Uji, Tokyo, JP;
Fujio Harako, Kanagawa, JP;
Minoru Shimada, Kanagawa, JP;
Ryoh Miura, Kanagawa, JP;
Yoshiaki Uji, Tokyo, JP;
Fujio Harako, Kanagawa, JP;
Minoru Shimada, Kanagawa, JP;
Ryoh Miura, Kanagawa, JP;
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
Embodiments of the present invention efficiently conduct a test for detecting defects on a magnetic disk more accurately. According to one embodiment, a HDD carries out defect inspection of a magnetic disk using thermal fly height control (TFC). Changing a clearance by the TFC achieves defect inspection tests under varied test conditions without much decrease of throughput in manufacturing HDDs. First, a self analysis test (SAT) is carried out in a state that a heater power of Pis supplied to a heater. Then, another SAT is carried out in a state that a heater power of Pis supplied to the heater. The heater power Pis larger than the heater power P
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile