The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2009

Filed:

Sep. 06, 2007
Applicants:

Yoshimasa Ogawa, Himeji, JP;

Kazuyuki Kaneda, Himeji, JP;

Katsutoshi Kabeta, Himeji, JP;

Inventors:

Yoshimasa Ogawa, Himeji, JP;

Kazuyuki Kaneda, Himeji, JP;

Katsutoshi Kabeta, Himeji, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01N 33/48 (2006.01); G01N 21/00 (2006.01); G01N 21/75 (2006.01);
U.S. Cl.
CPC ...
Abstract

Microchip testing device having a chip holder that can be exactly positioned and from which adhered sample liquid can be removed easily. The microchip testing device has a chip holder, with a cover and a box area, mounted on a measurement stage, a microchip that has an optical measurement chamber is housed in the chip holder, a light source that radiates light on the optical measurement chamber of the microchip, a detector that receives light that has passed through the optical measurement chamber, and a controller that controls the device. The chip holder has reference planes to position the microchip in two directions perpendicular to the optical axis of the optical measurement chamber and pushers that push the microchip against the reference planes, so that the microchip is positioned within the chip holder by closing the cover of the chip holder.


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