The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2009

Filed:

Dec. 22, 2005
Applicant:

Steven M. Fischer, Hayward, CA (US);

Inventor:

Steven M. Fischer, Hayward, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/37 (2006.01); C07K 1/00 (2006.01); C07K 17/06 (2006.01); C07K 17/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a new and improved method for quantitative determination and/or identification of proteins in a sample. In one aspect, the invention provides a mass spectroscopic method for comparing protein levels in two or more samples by differentially isotopically labeling each sample's proteins' N- or C-termini. In another aspect, the invention provides a mass-spectroscopic method for identifying a sample as source for a protein from a mixture of two or more samples by differentially isotopically labeling each sample's proteins' N- or C-termini.


Find Patent Forward Citations

Fischer, Steven. (2009). Mass spectroscopic method for comparing protein levels in two or more samples (U.S. Patent No. 7635573). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7635573

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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