The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2009
Filed:
Mar. 02, 2007
Mariko Kobayashi, Tokyo, JP;
Tatsuo Yamaguchi, Tokyo, JP;
Toshifumi Mihashi, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
There is provided a Shack-Hartmann wavefront sensor which can repetitively perform a measurement at high speed and at short measurement intervals. An illuminating optical system includes a first polarizing optical member to alternately change a polarization condition to a first polarized light or a second polarized light, and illuminates a pulse light from a laser light source part to an ocular fundus of a subject eye through a first polarizing optical member. A light receiving optical system includes a second polarizing optical member to select each polarized light component of the reflected light from the subject eye illuminated according to the polarization condition of the first polarizing optical member, and a first and a second light receiving parts to alternately receive the reflected light of the selected polarized light component. An ophthalmologic measuring apparatus measures the wavefront aberration of the subject eye at short intervals based on the output of the first and the second light receiving parts.