The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2009
Filed:
Apr. 28, 2008
Eric Lawrence Barsness, Pine Island, MN (US);
Cary Lee Bates, Rochester, MN (US);
Mahdad Majd, Rochester, MN (US);
John Matthew Santosuosso, Rochester, MN (US);
Eric Lawrence Barsness, Pine Island, MN (US);
Cary Lee Bates, Rochester, MN (US);
Mahdad Majd, Rochester, MN (US);
John Matthew Santosuosso, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A run-time monitor allows defining sets of run-time error criteria and corresponding diagnostic action to take when the run-time error criteria is satisfied. One way to define the run-time error criteria is to take a baseline measurement of run-time errors that occur during normal processing conditions. A run-time error criteria may then be defined that is based on the baseline measurement. In this manner, a rate of run-time errors that normally occur may be ignored, while a rate of run-time errors in excess of the run-time error criteria could automatically initiate diagnostic action. In this manner, the ability of a programmer to debug run-time errors is significantly enhanced.