The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2009

Filed:

Nov. 22, 2005
Applicants:

Futoshi Haga, Sagamihara, JP;

Yutaka Kudo, Yokohama, JP;

Inventors:

Futoshi Haga, Sagamihara, JP;

Yutaka Kudo, Yokohama, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
Abstract

A server performance measurement system for efficiently measuring and collecting server performance differently depending on each business application in actual operation environment in which business applications are operated, includes a plurality of servers for processing requests from users, a load balancer for suitably distributing loads of the plurality of servers, a test management server computer and a test load control server computer, which can communicate with one another. The test management server computer includes a test start/end information processing unit, a server setting control unit, a test result information processing unit and a test result information management unit. The business application is operated in at least one of the plurality of servers to measure performance of the server.


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