The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2009
Filed:
Nov. 12, 2004
Applicants:
Hegeon Kwun, San Antonio, TX (US);
Sang-young Kim, San Antonio, TX (US);
Myoung-seon Choi, Taegu, KR;
Inventors:
Hegeon Kwun, San Antonio, TX (US);
Sang-Young Kim, San Antonio, TX (US);
Myoung-Seon Choi, Taegu, KR;
Assignee:
Southwest Research Institute, San Antonio, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G06G 7/56 (2006.01); G06G 7/48 (2006.01); G01B 5/28 (2006.01); G01F 1/00 (2006.01); G01N 27/00 (2006.01); G01N 27/82 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and system for simulating defects in conduits, where the defects are detected using long-range guided-wave inspection techniques. The guided wave interaction with a defect is treated as a one-dimensional problem of plane wave reflection from a boundary of different acoustic impedances. The defect waveform is simulated using an electrical transmission line model and inverse fast Fourier transformation.