The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2009

Filed:

Jul. 31, 2007
Applicants:

Stephen J. Engel, East Northport, NY (US);

David H. Hoitsma, Brentwood, NY (US);

Inventors:

Stephen J. Engel, East Northport, NY (US);

David H. Hoitsma, Brentwood, NY (US);

Assignee:

Northrop Grumman Corporation, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a method for generating a probability distribution for a desired variable. A hyper parameter density function is provided, from which values are randomly selected. The selected hyper parameter value is used to compute an input variable value. A value is randomly selected from each input variable probability density function. These values are input into a physics model to compute an output value. This process is repeated to generate numerous output values, which are then used to construct an output value probability density function. After the output value probability density function is constructed, output value sensor data is obtained. The output density function is updated using the sensor data and a probabilistic evaluation of the hyper parameters. Improved predictions are iteratively made with the updated output distribution.


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