The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2009
Filed:
Jul. 26, 2007
Andrea Andenna, Baden, CH;
Andrea Moroni, Gorla Minore, IT;
Giovanni Invernizzi, Melzo, IT;
ABB Research Ltd, Zurich, CH;
Abstract
A method and diagnostic device are disclosed which can receive process variable values (x(t)) of a process variable of a process medium of a process, and extract and record measurement statistics data from such process variable values, which are measured during a measuring phase. Training statistics data can be extracted and recorded from such process variable values, which are measured during a training phase. The measurement statistics data can be compared with training statistics data recorded before the measurement statistics data. The training statistics data can include a training empirical statistical distribution, which can be a distribution of a function of process variable values, which are measured during a training phase, or a distribution of a function of coefficients X(k), which are coefficients of a function of a transform of process variable values (x(t)), which are measured during a training phase.